X-ray Photoelectron Spectroscopy

How to apply XPS and related techniques with real-world case studies X-ray photoelectron spectroscopy has become the cornerstone technique for characterizing the composition and chemistry of solid surfaces. X-ray Photoelectron Spectroscopy: An Introduction to Principles and Practices , Second Edition, delivers thoroughly revised coverage (along with two new chapters) reflecting significant advances since the first edition. Paul van der Heide, with decades of hands-on experience in surface analysis, guides readers from foundational concepts to practical applications. This starts with a prelude on the discovery of photoelectron emission to the impact of surface science. Hardware from both a components and system level are then introduced with a short foray into related techniques (such as HAXPES and NAP-XPS) along with what relates and differentiates XPS and PES. Topics included range from sample handling, methodology development, instrument operation, automation, quantification to data interpretation. This is tied up with a selection of lab, fab and synchrotron based case studies. Students through to practitioners in the areas of chemistry, physics, and/or material science will find this an authoritative resource for understanding and applying XPS and related techniques.